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A SIMPLE SOURCE CELL DESIGN FOR MBEKUBIAK RA; DRISCOLL P; PARKER EHC et al.1982; J. VAC. SCI. TECHNOL.; ISSN 0022-5355; USA; DA. 1982; VOL. 20; NO 2; PP. 252-253; BIBL. 8 REF.Article

STATIC SECONDARY ION MASS SPECTROSCOPY (SSIMS) ANALYSIS OF THE MICA SURFACE.DOWSETT MG; KING RM; PARKER EHC et al.1978; SURF. SCI.; NETHERL.; DA. 1978; VOL. 71; NO 3; PP. 541-547; BIBL. 12 REF.; 3 ILL.Article

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ELECTRICAL AND STRUCTURAL PROPERTIES OF INAS LAYERS ON (100) GAAS SUBSTANCES PREPARED BY MOLECULAR BEAM DEPOSITIONMEGGITT BT; PARKER EHC; KING RM et al.1980; J. CRYST. GROWTH; ISSN 0022-0248; NLD; DA. 1980; VOL. 50; NO 2; PP. 538-548; BIBL. 48 REF.Article

MODIFICATIONS TO THE ELECTRICAL OF PBTE BY LOW-ENERGY ION BOMBARDMENT-INTERPRETATION IN TERM OF DIFFERENTIAL SPUTTERING AND ATOMIC MIXINGKUBIAK RA; PARKER EHC; KING RM et al.1983; JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY. A, VACUUM, SURFACES, AND FILMS; ISSN 512915; USA; DA. 1983; VOL. 1; NO 1; PP. 34-40; BIBL. 38 REF.Article

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